Mil-Spec for Diodes and Transistors

The lot from which the JAN device comes receives stringent testing on a sample basis.  The individual JAN transistor or diode receives no additional testing.  If the samples past, the lot passes and every transistor or diode in the lot can be marked  "J A N".

Each JANTX device receives substantial additional testing and processing to ensure its reliability.  The most important test in TX is the 168 hour burn in.  Each device is put into an electrical circuit and power is applied for one-week.  After the week is up, the device is taken out and electrically tested.  If it passes it can be marked and sold as a JANTX device.

In addition to the TX testing, a device slated to be a “V” must undergo stringent visual inspection prior to having the lid put on the can.  This is called “Precap Visual Inspection” and is done under a microscope at l0x to look for cracks in the die.